Field Emission Scanning Electron Microscope
Booking Details
 

 

 

 

 

 

 


Name of the equipment:

Field Emission Scanning Electron Microscope

 

Make & Model:

ZEISS, Gemini 1 Sigma 300

 

I-Stem Registration ID-

…………………..                

 

Category of Instrument

Bioscience and Technology

 

Types of Analysis / Testing

Characterization

 

Application:

It's used to generate high-resolution images of surface topography and chemical composition, enabling analysis of materials, structures, and particles at a microscopic level.

Description of Instrument

SEM is a type of microscope that uses a focused beam of electrons to create detailed images of a sample's surface

 

 

Book through I-STEM:

https://www.istem.gov.in/

 

Slot Booking Link

I-STEM Slot Booking link for External User

Contact Details

Booking available for

Internal and External Both

 

Requisition form for

Internal

External

 

 

 

 

 

 

 

 

Faculty In-charge:

Dr. Soney Varghese

 

Email ID:

soneyva@nitc.ac.in

 

Phone number:

 +91-9446792019

 

Technical Staff:

Jayadevan P J (TE) jayadevanpj@nitc.ac.in

 

Akshay Venu (TE)

akshayvenu@nitc.ac.in

 

 

 

 

Department

MSED

 

Office Email ID

smseoffice@nitc.ac.in

 

Location

Room No. 101, Department of Materials Science and Engineering

 

Lab Phone No

04952286528

 

 

Features, Working Principle and Specifications  

 

 


Features of the equipment

 

ü  High resolution imaging: 0.8mm at 15kV, 1nm at 1kV

ü  Field emission gun(FEG) for high brightness & stability

 

Unique features/Measurement capabilities, if any

Ø  Gemini 1 column for high resolution imaging & analysis

Ø  Energy dispersive spectroscopy(EDS) For elemental analysis

Instrument Technical Description and Major Specifications

 

§  Gemini 1 optics: Combines electrostatic and magnetic fields to maximize optical performance while minimizing field influences on the sample

§  Inlens Detection Concept: Efficient signal detection for high quality imaging

§  Motorized stage with dual joystick control

§  Advanced vacuum system for stable and reliable operation

 

Measurement/Sample specifications:

§  Maximum 150mm diameter,50mm height

§  We can analyze both conducting and non-conducting materials including biological samples

§  Only dry samples can analyze

 

User Charges Rs. (GST Extra)

 



 

Internal

External Academic Institutes

National R&D Lab

Industry

SEM Only

500

1500

1500

4000

EDS Only

500

1000

1000

2000

SEM+EDS

750

2000

2000

5000

SEM+EDS               Mapping

1000

2250

2250

5000

EDS Map Only

600

1250

1250

2000

Gold Coating

NIL

250

250

500